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2017 | Computing & IT
This book introduces readers to an advanced combinatorial testing approach and its application in the cloud environment. Based on test algebra and fault location analysis, the proposed combinatorial testing method can support experiments with 250 components (with 2 * (250) combinations), and can detect the fault location based on the testing results. This function can efficiently decrease the size of candidate testing sets and therefore increase testing efficiency. The proposed solution's effectiveness in the cloud environment is demonstrated using a range of experiments.
Wei-Tek Tsai
(Author)
| Published by | Springer Verlag, Singapore |
| Edition | Unknown |
| ISBN | 9789811044809 |
| Language | N/A |
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