Metrology and Physical Mechanisms in New Generation Ionic Devices: 2016

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Metrology and Physical Mechanisms in New Generation Ionic Devices: 2016

2016 | Science & Mathematics

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.



Published by Springer International Publishing AG

Edition Unknown
ISBN 9783319395302
Language N/A

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